Topics of parallel sessions

  

Category A: Facility Development

A1. facility updates

A2. FEL facilities

A3. novel ID’s

A4. integrated facilities, e.g. synchrotron and cryo-electron microscopy

A5. complementarity with new high power laser sources (attosecond sources, etc.)

A6. industrial applications


Category B: Spectroscopy and In-Situ/Operando Methods

B1. XAS (including MCD)

B2. IXS, emission and RIXS

B3. time resolved spectroscopy techniques

B4. photoemission ARPES (including ARPES, HAXPES and ambient-pressure PES, etc.)

B5. high-pressure method

B6. combination of IR with X-rays 

B7. in-situ and operando techniques

B8. micro–nanospetroscopy


Category C: Imaging and Structural Characterization

C1. full-field imaging/microscopy, e.g. TXM, PXM, tomography, PEEM, etc.

C2. scanning imaging/microscopy, e.g. STXM, nano probes, etc.

C3. coherent & ptychographic techniques 

C4. time-resolved techniques, ultrafast & FEL

C5. advanced crystallography

C6. structural biology techniques

C7. biomedical imaging

C8. X-ray absorption/scattering for soft or biomaterials, e.g. SAX, BioSAXS, etc.

C9. X-ray absorption/scattering for hard materials, e.g. EAXFS, XPD, XRS, etc. 


Category D: BL, Detector and Data

D1. X-ray optics (including new crystal materials for high-resolution diffractive optics & new special focusing/collimating multi-layer optics)

D2. monochromators: DCM, grating, multilayers, etc.

D3. beamline innovation

D4. beam diagnosis and monitoring

D5. detectors

D6. sample environment & delivery systems

D7. approaches for minimizing radiation damage

D8. data acquisition and on-the-fly data processing

D9. data management (including data synthesis, simulation,and storage)